The Impact of Soft Error on C-Elements Due to Process Corner Variation and Temperature

The Impact of Soft Error on C-Elements Due to Process Corner Variation and Temperature

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This paper presents current injection resemble single event upset (SEU) current at the vulnerable nodes on Bike Parts - Tools different configurations of C-elements under two different scenarios: process corner and temperature.The objectives are to identify the vulnerable nodes due to SEU and to find the critical charges needed to flip the output from low to high (0-1) and high to low (1-0) on different configurations After Shaves of C-elements.The comparisons of C-elements in term of the resistivity toward soft error are presented.